Atomic Force Microscopes

Atomic Force Microscopes

  • Top-level AFM for entry-level budgets
  • Biggest sample stage in price segment (50 mm fully addressable)
  • Fastest time-to-measure on the market (only 3 min)
  • Scan size of 15 µm in Z and 90 µm x 90 µm in X and Y direction
  • Cantilever exchange in less than 10 seconds
  • All modes on the same sample spot without head exchange

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