Atomic Force Microscopes Atomic Force Microscopes Top-level AFM for entry-level budgetsBiggest sample stage in price segment (50 mm fully addressable)Fastest time-to-measure on the market (only 3 min)Scan size of 15 µm in Z and 90 µm x 90 µm in X and Y directionCantilever exchange in less than 10 secondsAll modes on the same sample spot without head exchange Contact Us First Name Last Name Email Mobile Message Send